Wafer-level light-emitting device optical characteristic measurement apparatus
Measure and inspect various optical characteristics of light-emitting devices such as VCSELs at the wafer level!
The "Wafer-Level Light Emitting Device Optical Characteristic Measurement System" is a system that analyzes the electrical and optical characteristics of various light-emitting devices such as VCSELs at the wafer level. In addition to the electrical characteristic measurements necessary for VCSEL characterization, it is capable of performing optical characteristic measurements at the wafer level, including light beam profile measurement, FFP measurement (radiation angle distribution measurement), IVL measurement, and polarization measurement. 【Features】 ■ By combining with manual probers and semi-automatic probers, it enables the measurement of various electrical and optical characteristics of light-emitting devices such as VCSELs at the wafer level. ■ The linkage function with the Form Factor semi-automatic prober system achieves automation, acceleration, and labor-saving of various measurements. ■ Equipped with our optical measurement and analysis software, Optometrics Customized Version for LD, among others. *For more details, please download the PDF or feel free to contact us.
- Company：シナジーオプトシステムズ
- Price：Other
